Dr. Blanchard has over 35 years experience in the semiconductor and electronics industries, with Fairchild Semiconductor, Supertex, Siliconix, IXYS Corporation, Failure Analysis Associates (Exponent), IP Managers and SVEWG. Dr. Blanchard has also served as an independent consultant and expert witness in semiconductor technology, and a Professor of Electrical Engineering at Foothill College. Dr. Blanchard was previously Principal Engineer and Engineering Manager of the Electrical & Electronic Division of Failure Analysis (Exponent) Associates, where he was employed for seven years. As Division Manager, he performed numerous forensic tests and analysis of electronic and electrical systems and of semiconductor devices. These were often subject to legal disputes, particularly those involving intellectual property rights. Dr. Blanchard has testified in court and served on numerous occasions as an expert witness on technologies that include MOS, MOSFET & bipolar device technology; semiconductor device physics; microchip fabrication & analysis; electronic systems; electrical & electronic failures; ESD & EOS failures; semiconductor device/integrated circuit assembly & packaging; CMOS, DMOS & BiCMOS; power IC`s & power electronics; printed circuit board (PCB) manufacturing; semiconductor process & control. In addition, he has served as an arbitrator and a Special Master to the court. Dr. Blanchard has published several books and numerous articles on semiconductor technology and devices. He holds more than 130 US patents on semiconductor technology and is a member of the IEEE, the Electrostatic Discharge Society, and the International Micro-circuits and Packaging Society. He received his BSEE and MSEE degrees from MIT in 1970 and his Ph.D. in Electrical Engineering from Stanford University in 1982.